Invention Grant
- Patent Title: Defect and maintenance detection for image capture device
- Patent Title (中): 图像捕获设备的缺陷和维护检测
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Application No.: US12138347Application Date: 2008-06-12
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Publication No.: US07957032B2Publication Date: 2011-06-07
- Inventor: Ravi Prakash
- Applicant: Ravi Prakash
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Hoffman Warnick LLC
- Agent Douglas Lashmit
- Main IPC: H04N1/40
- IPC: H04N1/40

Abstract:
Defect and maintenance detection for an image capture device (ICD) capable of distinguishing between a defect in the ICD and one on the imaged object. The defect detection system includes, inter alia: a value combiner that combines a brightest image video value for each sensing element of the ICD experiencing the imaged object with a corresponding stored device video value to create a combined value for each image video value; and a defect determinator determines the presence of a defect(s) by comparing the combined values to a defect threshold. The maintenance detection system includes a determinator that determines when maintenance is required based on whether a single image is considered defective or whether a number of consecutive defective images have been created. Device video values are updated sluggishly according to corresponding image video values.
Public/Granted literature
- US20080246862A1 DEFECT AND MAINTENANCE DETECTION FOR IMAGE CAPTURE DEVICE Public/Granted day:2008-10-09
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