Invention Grant
US07957190B2 Memory having P-type split gate memory cells and method of operation
有权
具有P型分离栅极存储单元的存储器及其操作方法
- Patent Title: Memory having P-type split gate memory cells and method of operation
- Patent Title (中): 具有P型分离栅极存储单元的存储器及其操作方法
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Application No.: US12130197Application Date: 2008-05-30
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Publication No.: US07957190B2Publication Date: 2011-06-07
- Inventor: Cheong M. Hong , Sung-Taeg Kang , Brian A. Winstead
- Applicant: Cheong M. Hong , Sung-Taeg Kang , Brian A. Winstead
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Daniel D. Hill
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A memory comprising a plurality of P-channel split-gate memory cells are organized in rows and columns. Each of the plurality of P-channel split-gate memory cells comprises a select gate, a control gate, a source region, a drain region, a channel region, and a charge storage layer comprising nanocrystals. Programming a memory cell of the plurality of P-channel split-gate memory cells comprises injecting electrons from a channel region of the memory cell to the charge storage layer. Erasing the memory cell comprises injecting holes from the channel region to the charge storage region.
Public/Granted literature
- US20090296491A1 MEMORY HAVING P-TYPE SPLIT GATE MEMORY CELLS AND METHOD OF OPERATION Public/Granted day:2009-12-03
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