Invention Grant
US07957215B2 Method and apparatus for generating temperature-compensated read and verify operations in flash memories 有权
用于在闪速存储器中产生温度补偿读取和验证操作的方法和装置

  • Patent Title: Method and apparatus for generating temperature-compensated read and verify operations in flash memories
  • Patent Title (中): 用于在闪速存储器中产生温度补偿读取和验证操作的方法和装置
  • Application No.: US11866264
    Application Date: 2007-10-02
  • Publication No.: US07957215B2
    Publication Date: 2011-06-07
  • Inventor: Toru Tanzawa
  • Applicant: Toru Tanzawa
  • Applicant Address: US ID Boise
  • Assignee: Micron Technology, Inc.
  • Current Assignee: Micron Technology, Inc.
  • Current Assignee Address: US ID Boise
  • Agency: TraskBritt
  • Priority: JP2005-246241 20050826
  • Main IPC: G11C8/00
  • IPC: G11C8/00 G11C11/34
Method and apparatus for generating temperature-compensated read and verify operations in flash memories
Abstract:
Methods and an apparatuses for generating a word-line voltage are disclosed. A word-line voltage generator includes a first current source, an adjustable current source, adjustable current sink, and a voltage converter, all operably coupled to a current sum node. The first current source generates a first current having a temperature coefficient substantially equal to a temperature coefficient of at least one-bit cell. The adjustable current source generates a second current that is substantially independent of a temperature change. The adjustable current sink sinks a third current that is substantially independent of a temperature change. The voltage converter is configured for generating a word-line signal having a word-line voltage proportional to a reference current, wherein the reference current comprises the first current, plus the second current, and minus the third current.
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