Invention Grant
- Patent Title: Fast phase-frequency detector arrangement
- Patent Title (中): 快速相位检波器布置
-
Application No.: US12759519Application Date: 2010-04-13
-
Publication No.: US07957500B2Publication Date: 2011-06-07
- Inventor: Mihai Adrian Tiberiu Sanduleanu , Eduard Ferdinand Stikvoort
- Applicant: Mihai Adrian Tiberiu Sanduleanu , Eduard Ferdinand Stikvoort
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP04101278 20040329
- Main IPC: H03D3/24
- IPC: H03D3/24

Abstract:
A detector arrangement for detecting a frequency error between an input signal (DATA) and a reference signal. The detector arrangement comprising first latch circuitry (L1, L2) for sampling a quadrature component (CKQ) of the reference signal based on the input signal, to generate a first binary signal (PDQ); second latch circuitry (L3, L4) for sampling an in-phase component (CKI) of the reference signal based on the input signal, to-generate a second binary signal (PD I); third latch circuitry (L5) for sampling the first binary signal based on the second binary signal, to generate the frequency error signal (FD). The detector further comprising control circuitry (TS) for selectively suppressing operation of a charge pump (82) to which the first binary signal (PDQ) is supplied, in response to a control signal derived from the second binary signal.
Public/Granted literature
- US20100205488A1 FAST PHASE-FREQUENCY DETECTOR ARRANGEMENT Public/Granted day:2010-08-12
Information query
IPC分类: