Invention Grant
- Patent Title: Method for automatically inspecting polar directions of polar element
- Patent Title (中): 自动检测极性元件极性方向的方法
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Application No.: US11767483Application Date: 2007-06-23
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Publication No.: US07957578B2Publication Date: 2011-06-07
- Inventor: Chung-Hwa Chang , Hsin-Ching Su
- Applicant: Chung-Hwa Chang , Hsin-Ching Su
- Applicant Address: TW Taipei
- Assignee: ASUSTeK Computer Inc.
- Current Assignee: ASUSTeK Computer Inc.
- Current Assignee Address: TW Taipei
- Agency: Jianq Chyun IP Office
- Priority: TW95127439A 20060727
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A method for automatically inspecting positive and negative polar directions of a polar element on a substrate is provided. Firstly, an image of a standard substrate is retrieved to form a standard sample, and relevant data of the polar elements on a substrate to be inspected is obtained to form the inspected sample. Then, transforming the geometry coordinates to the pixel coordinates, using different shapes of frames to make each polar element be positioned within, and marking the positions, positive and negative polar directions of all the polar elements in the image of the standard substrate. A database is set up to record the relevant data of each polar element as the standard sample for inspecting. The standard sample is compared with all the samples to be inspected to inspect whether the polar directions of each polar element is correct or not.
Public/Granted literature
- US20080025595A1 METHOD FOR AUTOMATICALLY INSPECTING POLAR DIRECTIONS OF POLAR ELEMENT Public/Granted day:2008-01-31
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