Invention Grant
- Patent Title: Parameter learning method, parameter learning apparatus, pattern classification method, and pattern classification apparatus
- Patent Title (中): 参数学习方法,参数学习装置,模式分类方法和模式分类装置
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Application No.: US11769143Application Date: 2007-06-27
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Publication No.: US07958070B2Publication Date: 2011-06-07
- Inventor: Yusuke Mitarai , Masakazu Matsugu , Katsuhiko Mori , Kan Torii , Hiroshi Sato
- Applicant: Yusuke Mitarai , Masakazu Matsugu , Katsuhiko Mori , Kan Torii , Hiroshi Sato
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA, Inc. IP Div
- Priority: JP2006-181896 20060630
- Main IPC: G06F15/18
- IPC: G06F15/18

Abstract:
A plurality of pieces of learning data, each associated with a class to which the piece of the learning data belong, are input. In each piece of the learning data, a statistical amount of attribute values of elements in each of specific k parts, k being equal to or larger than 1, is calculated. Each piece of the learning data is mapped in a k-dimensional feature space as a vector having the calculated k statistics amounts as elements. Based on each piece of the mapped learning data and the classes to which the pieces of learning data belong, parameters for classifying input data into one of the plurality of classes are learned in the k-dimensional feature space. By using the parameters, pattern classification can be performed with high speed and high accuracy.
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