Invention Grant
US07958070B2 Parameter learning method, parameter learning apparatus, pattern classification method, and pattern classification apparatus 有权
参数学习方法,参数学习装置,模式分类方法和模式分类装置

Parameter learning method, parameter learning apparatus, pattern classification method, and pattern classification apparatus
Abstract:
A plurality of pieces of learning data, each associated with a class to which the piece of the learning data belong, are input. In each piece of the learning data, a statistical amount of attribute values of elements in each of specific k parts, k being equal to or larger than 1, is calculated. Each piece of the learning data is mapped in a k-dimensional feature space as a vector having the calculated k statistics amounts as elements. Based on each piece of the mapped learning data and the classes to which the pieces of learning data belong, parameters for classifying input data into one of the plurality of classes are learned in the k-dimensional feature space. By using the parameters, pattern classification can be performed with high speed and high accuracy.
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