Invention Grant
US07958439B2 Defective memory block remapping method and system, and memory device and processor-based system using same
有权
存储器块重映射方法和系统不良,以及使用其的存储器件和基于处理器的系统
- Patent Title: Defective memory block remapping method and system, and memory device and processor-based system using same
- Patent Title (中): 存储器块重映射方法和系统不良,以及使用其的存储器件和基于处理器的系统
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Application No.: US12788053Application Date: 2010-05-26
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Publication No.: US07958439B2Publication Date: 2011-06-07
- Inventor: Dean Nobunaga , Hanqing Li
- Applicant: Dean Nobunaga , Hanqing Li
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G06F7/02
- IPC: G06F7/02 ; G11C16/04

Abstract:
A non-volatile memory device includes a block remapping system that offsets an input block address by the addresses of non-functional blocks to provide an output block address that is used to address the memory device. The system generates the output block addresses by, in effect, adding to the input block address the addresses of all non-functional blocks of memory that are between an initial address and the output block address. The system performs this function be comparing the input block address to the address of any defective block. If the address of the defective block is less than or equal to the input block address, the addresses of all defective blocks starting at the block address are added to the input block address. The system then iteratively performs this process using each output block address generated by the system in place of the input block address.
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