Invention Grant
- Patent Title: Scan type probe microscope and cantilever drive device
- Patent Title (中): 扫描型探针显微镜和悬臂驱动装置
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Application No.: US11915940Application Date: 2006-05-26
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Publication No.: US07958565B2Publication Date: 2011-06-07
- Inventor: Toshio Ando , Takayuki Uchihashi , Noriyuki Kodera , Hayato Yamashita
- Applicant: Toshio Ando , Takayuki Uchihashi , Noriyuki Kodera , Hayato Yamashita
- Applicant Address: JP Ishikawa
- Assignee: National University Corporation Kanazawa University
- Current Assignee: National University Corporation Kanazawa University
- Current Assignee Address: JP Ishikawa
- Agency: Pearne & Gordon LLP
- Priority: JP2005-159910 20050531
- International Application: PCT/JP2006/310535 WO 20060526
- International Announcement: WO2006/129561 WO 20061207
- Main IPC: G01B5/28
- IPC: G01B5/28

Abstract:
A driving laser unit (11) irradiates a laser beam on a cantilever (5) to cause thermal expansion deformation. A driving-laser control unit (13) performs feedback control for the cantilever (5) by controlling intensity of the laser beam on the basis of displacement of the cantilever (5) detected by a sensor (9). A thermal-response compensating circuit (35) has a constitution equivalent to an inverse transfer function of a heat transfer function of the cantilever (5) and compensates for a delay in a thermal response of the cantilever (5) to the light irradiation. Moreover, the cantilever (5) may be excited by controlling the intensity of the laser beam. By controlling light intensity, a Q value of a lever resonance system is also controlled. It is possible to increase scanning speed of an atomic force microscope.
Public/Granted literature
- US20090313729A1 SCAN TYPE PROBE MICROSCOPE AND CANTILEVER DRIVE DEVICE Public/Granted day:2009-12-17
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