Invention Grant
- Patent Title: System to control pressure in a test device
- Patent Title (中): 用于控制测试装置压力的系统
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Application No.: US12145193Application Date: 2008-06-24
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Publication No.: US07958768B2Publication Date: 2011-06-14
- Inventor: Pierre R. Delajoud , Robert B. Haines , Thomas A. Lohkamp
- Applicant: Pierre R. Delajoud , Robert B. Haines , Thomas A. Lohkamp
- Applicant Address: US WA Everett
- Assignee: Fluke Corporation
- Current Assignee: Fluke Corporation
- Current Assignee Address: US WA Everett
- Agency: Christensen O'Connor Johnston Kindness PLLC
- Main IPC: G01L27/00
- IPC: G01L27/00 ; G05D16/18 ; G05D16/02 ; F16K31/126 ; F16K39/00

Abstract:
Embodiments of the present invention are directed toward pressure controllers and calibrators for setting or measuring pressures in test devices. In one embodiment, the pressure controller contains a dual reference pressure controller. The dual reference pressure controller is operable to maintain two different pressures relative to a reference pressure. The first pressure being a relatively fixed amount greater than the reference pressure and the second pressure being a relatively fixed amount less than the reference pressure.
Public/Granted literature
- US20090314055A1 SYSTEM TO CONTROL PRESSURE IN A TEST DEVICE Public/Granted day:2009-12-24
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