Invention Grant
- Patent Title: Measuring device, measuring apparatus, and measuring method
- Patent Title (中): 测量装置,测量装置和测量方法
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Application No.: US12389997Application Date: 2009-02-20
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Publication No.: US07960132B2Publication Date: 2011-06-14
- Inventor: Takahiro Nakaminami , Jin Muraoka
- Applicant: Takahiro Nakaminami , Jin Muraoka
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-223800 20060821
- Main IPC: C12Q1/58
- IPC: C12Q1/58 ; G01N33/53 ; G01N21/00

Abstract:
A measuring device (100a) includes a base body (101) constituting: a sample holding portion (102) configured to hold a test sample containing urea and a material to be detected; and a sample supply port (103) through which the test sample is supplied to the sample holding portion (102). The base body includes an optical measuring portion and a reagent holding portion (111) which are configured to carry out an optical measurement of the test sample held by the sample holding portion (102). The reagent holding portion holds an antibody to the material to be detected and urease which causes hydrolysis of the urea. With this, the present invention provides a measuring device, a measuring apparatus, and a measuring method, each having a simple configuration and capable of reducing measurement errors caused by the urea contained in the test sample and accurately measuring the material to be detected.
Public/Granted literature
- US20090162879A1 MEASURING DEVICE, MEASURING APPARATUS, AND MEASURING METHOD Public/Granted day:2009-06-25
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