Invention Grant
- Patent Title: Manufacturing method for epitaxial wafer
- Patent Title (中): 外延晶圆的制造方法
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Application No.: US12645744Application Date: 2009-12-23
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Publication No.: US07960254B2Publication Date: 2011-06-14
- Inventor: Naoyuki Wada , Makoto Takemura
- Applicant: Naoyuki Wada , Makoto Takemura
- Applicant Address: JP Tokyo
- Assignee: Sumco Corporation
- Current Assignee: Sumco Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2008-327274 20081224
- Main IPC: H01L21/20
- IPC: H01L21/20 ; C23C16/00

Abstract:
To provide a manufacturing method for an epitaxial wafer that alleviates distortions on a back surface thereof due to sticking between a wafer and a susceptor, thereby preventing decrease in flatness thereof due to a lift pin. A manufacturing method for an epitaxial wafer according to the present invention includes: an oxide film forming step in which an oxide film is formed on a back surface thereof; an etching step in which a hydrophobic portion exposing a back surface of the semiconductor wafer is provided by partially removing the oxide film; a wafer placing step in which the semiconductor wafer is placed; and an epitaxial growth step in which an epitaxial layer is grown on a main surface of the semiconductor wafer; and the diameter of the lift pin installation circle provided on a circle on a bottom face of a susceptor is smaller than that of the hydrophobic portion.
Public/Granted literature
- US20100159679A1 MANUFACTURING METHOD FOR EPITAXIAL WAFER Public/Granted day:2010-06-24
Information query
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