Invention Grant
- Patent Title: Semiconductor structure with coincident lattice interlayer
- Patent Title (中): 具有重合晶格中间层的半导体结构
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Application No.: US12283368Application Date: 2008-09-11
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Publication No.: US07960259B2Publication Date: 2011-06-14
- Inventor: Brian D. Schultz , Gary Elder McGuire
- Applicant: Brian D. Schultz , Gary Elder McGuire
- Applicant Address: US NC Raleigh
- Assignee: International Technology Center
- Current Assignee: International Technology Center
- Current Assignee Address: US NC Raleigh
- Agency: Miller Patent Services
- Agent Jerry A. Miller
- Main IPC: H01L29/72
- IPC: H01L29/72

Abstract:
A semiconductor structure consistent with certain implementations has a crystalline substrate oriented with a {111} plane surface that is within 10 degrees of surface normal. An epitaxially grown electrically insulating interlayer overlays the crystalline substrate and establishes a coincident lattice that mates with the surface symmetry of the {111} plane surface. An atomically stable two dimensional crystalline film resides on the epitaxial insulating layer with a coincident lattice match to the insulating interlayer. Methods of fabrication are disclosed. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.
Public/Granted literature
- US20090079040A1 Semiconductor structure with coincident lattice interlayer Public/Granted day:2009-03-26
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