Invention Grant
US07960691B2 Second ion mass spectrometry method and imaging method 有权
第二离子质谱法和成像方法

  • Patent Title: Second ion mass spectrometry method and imaging method
  • Patent Title (中): 第二离子质谱法和成像方法
  • Application No.: US12308326
    Application Date: 2007-06-13
  • Publication No.: US07960691B2
    Publication Date: 2011-06-14
  • Inventor: Jiro Matsuo
  • Applicant: Jiro Matsuo
  • Applicant Address: JP Kyoto
  • Assignee: Kyoto University
  • Current Assignee: Kyoto University
  • Current Assignee Address: JP Kyoto
  • Agency: Hamre, Schumann, Mueller & Larson, P.C.
  • Priority: JP2006-163778 20060613
  • International Application: PCT/JP2007/061864 WO 20070613
  • International Announcement: WO2007/145232 WO 20071221
  • Main IPC: H01J49/26
  • IPC: H01J49/26 H01J49/24
Second ion mass spectrometry method and imaging method
Abstract:
The provision of a new method for analyzing organic molecules such as protein and endocrine disrupting chemicals with excellent sensitivity. A secondary ion mass spectrometry method using a heavy ion beam as a primary ion beam enables the detection of, for example, an organism-related material at the sub-amol level with high sensitivity. As a result, favorable imaging of an organism-related sample can be performed.
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