Invention Grant
- Patent Title: Second ion mass spectrometry method and imaging method
- Patent Title (中): 第二离子质谱法和成像方法
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Application No.: US12308326Application Date: 2007-06-13
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Publication No.: US07960691B2Publication Date: 2011-06-14
- Inventor: Jiro Matsuo
- Applicant: Jiro Matsuo
- Applicant Address: JP Kyoto
- Assignee: Kyoto University
- Current Assignee: Kyoto University
- Current Assignee Address: JP Kyoto
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- Priority: JP2006-163778 20060613
- International Application: PCT/JP2007/061864 WO 20070613
- International Announcement: WO2007/145232 WO 20071221
- Main IPC: H01J49/26
- IPC: H01J49/26 ; H01J49/24

Abstract:
The provision of a new method for analyzing organic molecules such as protein and endocrine disrupting chemicals with excellent sensitivity. A secondary ion mass spectrometry method using a heavy ion beam as a primary ion beam enables the detection of, for example, an organism-related material at the sub-amol level with high sensitivity. As a result, favorable imaging of an organism-related sample can be performed.
Public/Granted literature
- US20100155591A1 Second ion mass spectrometry method and imaging method Public/Granted day:2010-06-24
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