Invention Grant
- Patent Title: FinFET field effect transistor insulated from the substrate
- Patent Title (中): FinFET场效应晶体管与基板绝缘
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Application No.: US12837318Application Date: 2010-07-15
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Publication No.: US07960734B2Publication Date: 2011-06-14
- Inventor: Damien Lenoble
- Applicant: Damien Lenoble
- Applicant Address: FR Crolles BE Leuven
- Assignee: STMicroelectronics (Crolles 2) SAS,Interuniversitair Micro-Electronica Centrum
- Current Assignee: STMicroelectronics (Crolles 2) SAS,Interuniversitair Micro-Electronica Centrum
- Current Assignee Address: FR Crolles BE Leuven
- Agency: Gardere Wynne & Sewell LLP
- Agent Andre M. Szuwalski
- Priority: FR0704568 20070626
- Main IPC: H01L29/786
- IPC: H01L29/786

Abstract:
A finFET field effect transistor is produced by the formation of an electrical junction between the thin fin portion of semiconductor material which forms the channel of the transistor and the circuit substrate. Doping particles are implanted in the substrate through a mask which is then subsequently used to form the thin fin portion of the channel. The channel of the finFET transistor is thus electrically insulated from the circuit substrate in the same manner as in MOS integrated circuits realized from bulk silicon substrates.
Public/Granted literature
- US20100276693A1 FINFET FIELD EFFECT TRANSISTOR INSULATED FROM THE SUBSTRATE Public/Granted day:2010-11-04
Information query
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