Invention Grant
US07960754B2 Diode having high breakdown voltage and low on-resistance 有权
二极管具有高击穿电压和低导通电阻

  • Patent Title: Diode having high breakdown voltage and low on-resistance
  • Patent Title (中): 二极管具有高击穿电压和低导通电阻
  • Application No.: US12401586
    Application Date: 2009-03-10
  • Publication No.: US07960754B2
    Publication Date: 2011-06-14
  • Inventor: Martin Alter
  • Applicant: Martin Alter
  • Applicant Address: US CA San Jose
  • Assignee: Micrel, Inc.
  • Current Assignee: Micrel, Inc.
  • Current Assignee Address: US CA San Jose
  • Agency: Patent Law Group LLP
  • Main IPC: H01L29/66
  • IPC: H01L29/66
Diode having high breakdown voltage and low on-resistance
Abstract:
A Schottky or PN diode is formed where a first cathode portion is an N epitaxial layer that is relatively lightly doped. An N+ buried layer is formed beneath the cathode for conducting the cathode current to a cathode contact. A more highly doped N-well is formed, as a second cathode portion, in the epitaxial layer so that the complete cathode comprises the N-well surrounded by the more lightly doped first cathode portion. An anode covers the upper areas of the first and second cathode portions so both portions conduct current when the diode is forward biased. When the diode is reverse biased, the depletion region in the central N-well will be relatively shallow but substantially planar so will have a relatively high breakdown voltage. The weak link for breakdown voltage will be the curved edge of the deeper depletion region in the lightly doped first cathode portion under the outer edges of the anode. Therefore, the N-well lowers the on-resistance without lowering the breakdown voltage.
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