Invention Grant
- Patent Title: Capacitor device and method for manufacturing the same
- Patent Title (中): 电容器及其制造方法
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Application No.: US12364543Application Date: 2009-02-03
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Publication No.: US07960773B2Publication Date: 2011-06-14
- Inventor: Shu-Ming Chang , Chia-Wen Chiang
- Applicant: Shu-Ming Chang , Chia-Wen Chiang
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: TW97133268A 20080829
- Main IPC: H01L51/05
- IPC: H01L51/05

Abstract:
This invention provides a capacitor device with a high dielectric constant material and multiple vertical electrode plates. The capacitor devices can be directly fabricated on a wafer with low temperature processes so as to be integrated with active devices formed on the wafer. This invention also forms vertical conducting lines in the capacitor devices using the through-silicon-via technology to facilitate the three-dimensional stacking of the capacitor devices.
Public/Granted literature
- US20100052099A1 CAPACITOR DEVICE AND METHOD FOR MANUFACTURING THE SAME Public/Granted day:2010-03-04
Information query
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