Invention Grant
- Patent Title: Testing method of magnetic head by using inductance
- Patent Title (中): 使用电感测试磁头的方法
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Application No.: US12102569Application Date: 2008-04-14
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Publication No.: US07960968B2Publication Date: 2011-06-14
- Inventor: Hiroshi Kiyono , Takahiro Mori
- Applicant: Hiroshi Kiyono , Takahiro Mori
- Applicant Address: JP Tokyo
- Assignee: TDK Corporation
- Current Assignee: TDK Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Main IPC: G01R33/12
- IPC: G01R33/12 ; G11B5/127

Abstract:
It is an object of the present invention to provide a method for investigating magnetic domains, the method capable of easily grasping behavior of the magnetic domains in a head manufacturing process, and further to provide a testing method of a magnetic head capable of evaluating whether the writing performance of the magnetic head is good or not. The method for investigating magnetic domains comprises supplying direct current (DC) to a coil of an electromagnetic transducer provided in a magnetic head for writing data onto a magnetic recording medium; measuring an inductance of the electromagnetic transducer at each current value while varying the current value of the direct current; and investigating behavior of magnetic domains in a magnetic core of the electromagnetic transducer based on a relationship between the current values and the inductances. The testing method of a magnetic head comprises evaluating whether writing performance of the magnetic head is good or not, based on a relationship between the current values and the inductances.
Public/Granted literature
- US20090256557A1 TESTING METHOD OF MAGNETIC HEAD BY USING INDUCTANCE Public/Granted day:2009-10-15
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