Invention Grant
US07960996B2 Variable delay circuit, timing generator and semiconductor testing apparatus 有权
可变延迟电路,定时发生器和半导体测试装置

  • Patent Title: Variable delay circuit, timing generator and semiconductor testing apparatus
  • Patent Title (中): 可变延迟电路,定时发生器和半导体测试装置
  • Application No.: US12310335
    Application Date: 2007-08-15
  • Publication No.: US07960996B2
    Publication Date: 2011-06-14
  • Inventor: Masakatsu Suda
  • Applicant: Masakatsu Suda
  • Applicant Address: JP Tokyo
  • Assignee: Advantest Corp.
  • Current Assignee: Advantest Corp.
  • Current Assignee Address: JP Tokyo
  • Agency: Muramatsu & Associates
  • Priority: JP2006-227800 20060824
  • International Application: PCT/JP2007/065917 WO 20070815
  • International Announcement: WO2008/023624 WO 20080228
  • Main IPC: G01R31/26
  • IPC: G01R31/26
Variable delay circuit, timing generator and semiconductor testing apparatus
Abstract:
A variable delay circuit is designed to provided a wider range of delay time to a timing signal. The variable delay circuit includes a variable delay 50 which comprises a DA converter 51 which supplies current 51 based on delay setting data; a delay element 53 which imparts a delay amount Tpd to a prescribed signal and outputs the signal; and a bias circuit 52 which is connected such that the amount of current flown in the DA converter 51 and the amount of current flown in the delay element 53 become equal. The DA converter 51 allows the relationship between the delay setting data DATA and the current Id to be hyperbolic (inversely proportional). As a result, the relationship between the delay setting data DATA and the delay amount Tpd can be linearized, whereby the delay amount obtained by a single stage of the delay element can be increased.
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