Invention Grant
- Patent Title: Sub-resolution assist devices and methods
- Patent Title (中): 分解辅助装置和方法
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Application No.: US11745242Application Date: 2007-05-07
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Publication No.: US07961292B2Publication Date: 2011-06-14
- Inventor: Anton P. Eppich , Fei Wang
- Applicant: Anton P. Eppich , Fei Wang
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03F1/00

Abstract:
Photolithographic apparatus, systems, and methods that make use of sub-resolution assist devices are disclosed. In the various embodiments, an imaging mask includes an optically transmissive substrate having a sub-resolution assist device that further includes a first optical attenuation region and a spaced-apart second optical attenuation region, and an optically transmissive phase adjustment region interposed between the first optical attenuation region and the second optical attenuation region, the phase adjustment region being configured to change a phase of incident illumination radiation by altering an optical property of the substrate.
Public/Granted literature
- US20080278700A1 SUB-RESOLUTION ASSIST DEVICES AND METHODS Public/Granted day:2008-11-13
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