Invention Grant
- Patent Title: Physical quantity sensor and physical quantity measuring method
- Patent Title (中): 物理量传感器和物理量测量方法
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Application No.: US12360201Application Date: 2009-01-27
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Publication No.: US07961302B2Publication Date: 2011-06-14
- Inventor: Tatsuya Ueno
- Applicant: Tatsuya Ueno
- Applicant Address: JP Tokyo
- Assignee: Yamatake Corporation
- Current Assignee: Yamatake Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2008-020712 20080131
- Main IPC: G01P3/36
- IPC: G01P3/36

Abstract:
A physical quantity sensor has a semiconductor laser, a laser driver for providing, to the semiconductor laser, a driving electric current that is a waveform wherein the maximum portions and minimum portions of a triangle wave have been rounded; detecting means (a photodiode and a current-voltage converting amplifier) for detecting an electric signal that includes an interference waveform that is produced by the self-coupling effect between a laser beam that is emitted from the semiconductor laser and a return beam from a measurement object; and measuring means (a filter circuit, a counting device, and a calculating device) for calculating a physical quantity for the measurement object from interference waveform information.
Public/Granted literature
- US20090195771A1 PHYSICAL QUANTITY SENSOR AND PHYSICAL QUANTITY MEASURING METHOD Public/Granted day:2009-08-06
Information query
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