Invention Grant
- Patent Title: Spectroscopy module
-
Application No.: US12377306Application Date: 2008-06-10
-
Publication No.: US07961317B2Publication Date: 2011-06-14
- Inventor: Katsumi Shibayama , Takafumi Yokino , Tomofumi Suzuki , Helmut Teichmann , Dietmar Hiller , Ulrich Starker
- Applicant: Katsumi Shibayama , Takafumi Yokino , Tomofumi Suzuki , Helmut Teichmann , Dietmar Hiller , Ulrich Starker
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: Hamamatsu Photonics K.K.
- Current Assignee: Hamamatsu Photonics K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath, LLP
- Priority: JP2008-053715 20080304
- International Application: PCT/JP2008/060574 WO 20080610
- International Announcement: WO2009/110110 WO 20090911
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G01J3/18

Abstract:
Alignment marks 12a, 12b, 12c, and 12d are formed on the flat plane 11a of the peripheral edge portion 11 formed integrally with the diffracting layer 8, and when the lens portion 7 is mounted onto the substrate 2, these alignment marks 12a, 12b, 12c and 12d are positioned to the substrate 2, thereby making exact alignment of the diffracting layer 8 with respect to the light detecting portion 4a of the light detecting element 4, for example, not by depending on a difference in curvature radius of the lens portion 7. In particular, the alignment marks 12a, 12b, 12c and 12d are formed on the flat plane 11a, thereby image recognition is given to exactly detect positions of the alignment marks 12a, 12b, 12c and 12d, thus making it possible to make exact alignment.
Public/Granted literature
- US20100315633A1 SPECTROSCOPY MODULE Public/Granted day:2010-12-16
Information query