Invention Grant
- Patent Title: Wavelength identification method and analyzer
- Patent Title (中): 波长识别方法和分析仪
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Application No.: US12500908Application Date: 2009-07-10
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Publication No.: US07961324B2Publication Date: 2011-06-14
- Inventor: Osamu Okabayashi
- Applicant: Osamu Okabayashi
- Applicant Address: US CA Brea
- Assignee: Beckman Coulter, Inc.
- Current Assignee: Beckman Coulter, Inc.
- Current Assignee Address: US CA Brea
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: JP2007-004896 20070112
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
An analyzer analyzes a sample based on optical characteristics of the sample. The analyzer includes a measuring unit that measures absorbances of two or more wavelength identifying samples having different concentrations and having absorbance characteristics in which there is no extremum in a wavelength band including a wavelength to be identified, the wavelength identifying samples being made of a same material; a calculator that obtains a gradient of a straight line indicating a relationship between the concentrations and the absorbances of the identifying samples measured by the measuring unit; and an identifier that identifies an actual wavelength of light to be measured by the measuring unit, based on a degree of coincidence between the gradient of the straight line calculated by the calculator and at least one pre-obtained reference gradient of a straight line indicating a relationship between concentrations and absorbances of reference samples made of the same material as the wavelength identifying samples for at least one wavelength.
Public/Granted literature
- US20100007886A1 WAVELENGTH IDENTIFICATION METHOD AND ANALYZER Public/Granted day:2010-01-14
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