Invention Grant
US07961362B2 Method and apparatus for phase correction in a scanned beam imager
有权
扫描光束成像仪中相位校正的方法和装置
- Patent Title: Method and apparatus for phase correction in a scanned beam imager
- Patent Title (中): 扫描光束成像仪中相位校正的方法和装置
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Application No.: US12004474Application Date: 2007-12-19
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Publication No.: US07961362B2Publication Date: 2011-06-14
- Inventor: Jianhua Xu
- Applicant: Jianhua Xu
- Applicant Address: US WA Redmond
- Assignee: Microvision, Inc.
- Current Assignee: Microvision, Inc.
- Current Assignee Address: US WA Redmond
- Agent Kevin D. Wills
- Main IPC: H04N1/04
- IPC: H04N1/04

Abstract:
A method for detecting scanner phase error in a bidirectional scanned beam imager includes obtaining first and second images derived from respective first and second scan directions, comparing apparent image feature positions in the first and second images, and calculating a phase error corresponding to a difference between the apparent image feature positions. The comparison may include multiplying frequency domain transformations of the images.
Public/Granted literature
- US20090161181A1 Method and apparatus for phase correction in a scanned beam imager Public/Granted day:2009-06-25
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