Invention Grant
- Patent Title: Phase-change random access memory
- Patent Title (中): 相变随机存取存储器
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Application No.: US12771028Application Date: 2010-04-30
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Publication No.: US07961508B2Publication Date: 2011-06-14
- Inventor: Byung-Gil Choi , Du-Eung Kim , Woo-Yeong Cho , Hye-Jin Kim
- Applicant: Byung-Gil Choi , Du-Eung Kim , Woo-Yeong Cho , Hye-Jin Kim
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2006-0024049 20060315
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A phase-change random access memory includes a memory block including a plurality of memory columns corresponding to the same column address and using different input/output paths; a redundancy memory block including a plurality of redundancy memory columns using different input/output paths; and an input/output controller repairing at least one of the plurality of memory columns using at least one of the plurality of redundancy memory columns, and controlling the number of memory columns simultaneously repaired using redundancy memory columns in response to an input/output repair mode control signal.
Public/Granted literature
- US20100214832A1 PHASE-CHANGE RANDOM ACCESS MEMORY Public/Granted day:2010-08-26
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