Invention Grant
US07961559B2 Duty cycle measurement circuit for measuring and maintaining balanced clock duty cycle
有权
用于测量和维持平衡时钟占空比的占空比测量电路
- Patent Title: Duty cycle measurement circuit for measuring and maintaining balanced clock duty cycle
- Patent Title (中): 用于测量和维持平衡时钟占空比的占空比测量电路
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Application No.: US12539635Application Date: 2009-08-12
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Publication No.: US07961559B2Publication Date: 2011-06-14
- Inventor: Robert C. Dixon , Robert L. Franch , Phillip J. Restle
- Applicant: Robert C. Dixon , Robert L. Franch , Phillip J. Restle
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Law Office of Charles W. Patterson, Jr.
- Agent Brian P. Verminski, Esq.
- Main IPC: G04F8/00
- IPC: G04F8/00 ; H03K3/017 ; H03H11/26

Abstract:
A circuit and method for measuring duty cycle uncertainty in an on-chip global clock. A global clock is provided to a delay line at a local clock buffer. Delay line taps (inverter outputs) are inputs to a register that is clocked by the local clock buffer. The register captures clock edges, which are filtered to identify a single location for each edge. Imbalance in space between the edges indicated imbalance in duty cycle. Up/down signals are generated from any imbalance and passed to a phase locked loop to adjust the balance.
Public/Granted literature
- US20090295449A1 DUTY CYCLE MEASUREMENT CIRCUIT FOR MEASURING AND MAINTAINING BALANCED CLOCK DUTY CYCLE Public/Granted day:2009-12-03
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