Invention Grant
US07961629B2 Test apparatus, test method, waveform generator and waveform generating method
有权
测试仪器,测试方法,波形发生器和波形生成方法
- Patent Title: Test apparatus, test method, waveform generator and waveform generating method
- Patent Title (中): 测试仪器,测试方法,波形发生器和波形生成方法
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Application No.: US11741771Application Date: 2007-04-30
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Publication No.: US07961629B2Publication Date: 2011-06-14
- Inventor: Motoo Ueda
- Applicant: Motoo Ueda
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Osha • Liang LLP
- Main IPC: H04L12/26
- IPC: H04L12/26

Abstract:
A test apparatus, which is for testing a device under test including a receiving circuit for receiving signals transmitted through a communication cable, includes: a waveform generating section for outputting waveform data to define a waveform to be provided to an input terminal of a receiving circuit; a digital filter having the filter characteristic substantially reverse to the attenuation characteristic of the communication cable, for outputting amplified waveform data obtained by amplifying the waveform data; a DA converter for converting the amplified waveform data to an analog waveform; and a low-pass filter having the attenuation characteristic substantially same as that of the communication cable, for attenuating the analog waveform and providing the same to the receiving circuit.
Public/Granted literature
- US20080239966A1 TEST APPARATUS, TEST METHOD, WAVEFORM GENERATOR AND WAVEFORM GENERATING METHOD Public/Granted day:2008-10-02
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