Invention Grant
US07961629B2 Test apparatus, test method, waveform generator and waveform generating method 有权
测试仪器,测试方法,波形发生器和波形生成方法

  • Patent Title: Test apparatus, test method, waveform generator and waveform generating method
  • Patent Title (中): 测试仪器,测试方法,波形发生器和波形生成方法
  • Application No.: US11741771
    Application Date: 2007-04-30
  • Publication No.: US07961629B2
    Publication Date: 2011-06-14
  • Inventor: Motoo Ueda
  • Applicant: Motoo Ueda
  • Applicant Address: JP Tokyo
  • Assignee: Advantest Corporation
  • Current Assignee: Advantest Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Osha • Liang LLP
  • Main IPC: H04L12/26
  • IPC: H04L12/26
Test apparatus, test method, waveform generator and waveform generating method
Abstract:
A test apparatus, which is for testing a device under test including a receiving circuit for receiving signals transmitted through a communication cable, includes: a waveform generating section for outputting waveform data to define a waveform to be provided to an input terminal of a receiving circuit; a digital filter having the filter characteristic substantially reverse to the attenuation characteristic of the communication cable, for outputting amplified waveform data obtained by amplifying the waveform data; a DA converter for converting the amplified waveform data to an analog waveform; and a low-pass filter having the attenuation characteristic substantially same as that of the communication cable, for attenuating the analog waveform and providing the same to the receiving circuit.
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