Invention Grant
- Patent Title: Generated set top calibration patterns in manufacturing
- Patent Title (中): 制造中生成的机顶校准模式
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Application No.: US11427747Application Date: 2006-06-29
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Publication No.: US07961780B2Publication Date: 2011-06-14
- Inventor: Leo Montreuil , Wayne B. Williams , Samuel H. Russ , Robert A. Kriete
- Applicant: Leo Montreuil , Wayne B. Williams , Samuel H. Russ , Robert A. Kriete
- Agency: Merchant & Gould
- Main IPC: H04B17/00
- IPC: H04B17/00
Abstract:
Included are systems and methods for performing an internal operations test to a set top terminal (STT). At least one embodiment of a method includes creating a test pattern for testing video functionality of the STT, sending the created test pattern to a digital encoder, and converting the test pattern to an analog signal.
Public/Granted literature
- US20080022339A1 Generated Set Top Calibration Patterns in Manufacturing Public/Granted day:2008-01-24
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