This is a shim cleaning blade for use in a novel cleaning station of an electrophotographic marking system having an a-Si photoconductive surface. The cleaning blade is preferably made from stainless steel but other metals can be used if suitable. The blade has a thickness of about 0.05-0.2 mm, but best results are obtained when using a thickness of about 005-0.1 mm. The cleaning blade contacts the photoconductive surface it is cleaning at an angle of from about 2 to about 40 degrees.