Invention Grant
- Patent Title: Driver circuit and test apparatus
- Patent Title (中): 驱动电路和测试仪器
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Application No.: US12030878Application Date: 2008-02-14
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Publication No.: US07962110B2Publication Date: 2011-06-14
- Inventor: Kensuke Kamo , Takashi Sekino , Toshiaki Awaji
- Applicant: Kensuke Kamo , Takashi Sekino , Toshiaki Awaji
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Jianq Chyun IP Office
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
Provided is a driver circuit that outputs a transmission signal according to a reception signal received from outside, including a first driver that outputs a voltage according to an input first signal; a second driver that receives the voltage output by the first driver as a power supply voltage and outputs the transmission signal according to the power supply voltage and an input second signal; and a control section that delays both the first signal and the second signal, according to a change of the reception signal, and causes the transmission signal according to the reception signal to be output from the second driver.
Public/Granted literature
- US20090209210A1 DRIVER CIRCUIT AND TEST APPARATUS Public/Granted day:2009-08-20
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