Invention Grant
- Patent Title: Sample analyzer and sample analyzing method
- Patent Title (中): 样品分析仪和样品分析方法
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Application No.: US12012431Application Date: 2008-01-31
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Publication No.: US07962292B2Publication Date: 2011-06-14
- Inventor: Naohiko Matsuo , Hiroyuki Fujino , Mitsuyo Koya , Susumu Hoshiko
- Applicant: Naohiko Matsuo , Hiroyuki Fujino , Mitsuyo Koya , Susumu Hoshiko
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Hofer Gilson & Lione
- Priority: JP2007-020942 20070131
- Main IPC: G01N31/00
- IPC: G01N31/00

Abstract:
A sample analyzer optically measures reaction of a sample mixed with reagent, and obtains optical information therefrom; generates a reaction curve representing change in the optical information over time; determines a first area prior to an evaluation target time (t0) and a second area after the evaluation target time (t0) wherein the first and second areas are formed between a baseline which is parallel to the time axis and a reaction curve from a first time (t1) prior to the optional evaluation target time (t0) to a second time (t2) after the evaluation target time, and determines the reaction end point based on the first and second areas; and obtains a characteristic of a sample based on the determined reaction end point, is disclosed. a sample analyzing method is also disclosed.
Public/Granted literature
- US20080183431A1 Sample analyzer and sample analyzing method Public/Granted day:2008-07-31
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