Invention Grant
- Patent Title: Device for thorough testing of secure electronic components
- Patent Title (中): 用于彻底测试安全电子元件的设备
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Application No.: US12112182Application Date: 2008-04-30
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Publication No.: US07962304B2Publication Date: 2011-06-14
- Inventor: Eric C. Pearson , Michael A. Howard
- Applicant: Eric C. Pearson , Michael A. Howard
- Applicant Address: US CA Milpitas
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Christopher P. Maiorana, PC
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
An apparatus including a test circuit, an output circuit and a control circuit. The test circuit may be configured to generate test data in response to one or more test vectors. The output circuit may be configured to present data in a first mode and prevent presentation of data in a second mode. The output circuit may be configured to switch between the first mode and the second mode in response to a control signal. The control circuit may be configured to generate the control signal according to predetermined criteria for protecting secure data within the apparatus while allowing the test data to be presented.
Public/Granted literature
- US20090037133A1 DEVICE FOR THOROUGH TESTING OF SECURE ELECTRONIC COMPONENTS Public/Granted day:2009-02-05
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