Invention Grant
- Patent Title: Recording medium structure capable of displaying defect rate
- Patent Title (中): 能够显示缺陷率的记录介质结构
-
Application No.: US12024118Application Date: 2008-02-01
-
Publication No.: US07962810B2Publication Date: 2011-06-14
- Inventor: Wen-Jun Zeng
- Applicant: Wen-Jun Zeng
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Priority: TW96145410A 20071129
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
A recording medium structure capable of displaying a defect rate is provided. The recording medium has at least one use area with endurance blocks, and each endurance block has an endurance value. The recording medium structure has a housing, a first and a second off-line display units arranged on the housing for respectively displaying a real defect rate and a potential defect rate of the recording medium. The real defect rate is calculated based on an error correction coed, and the potential defect rate is calculated based on an endurance values recorded in the endurance table.
Public/Granted literature
- US20090141602A1 RECORDING MEDIUM STRUCTURE CAPABLE OF DISPLAYING DEFECT RATE Public/Granted day:2009-06-04
Information query