Invention Grant
- Patent Title: Method and system for debug and test using replicated logic
- Patent Title (中): 使用复制逻辑进行调试和测试的方法和系统
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Application No.: US12166298Application Date: 2008-07-01
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Publication No.: US07962869B2Publication Date: 2011-06-14
- Inventor: Chun Kit Ng , Mario Larouche
- Applicant: Chun Kit Ng , Mario Larouche
- Applicant Address: US CA Mountain View
- Assignee: Synopsys, Inc.
- Current Assignee: Synopsys, Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: G06F9/455
- IPC: G06F9/455 ; G06F17/50

Abstract:
A method and system for debug and test using replicated logic is described. A representation of a circuit is compiled. The circuit includes a replicated portion and delay logic to delay inputs into the replicated portion. The circuit may also include trigger logic and clock control logic to enable execution of the replicated portion of the circuit to be paused when a trigger condition occurs. The compiled representation of the circuit may be programmed into a hardware device. A debugger may then be invoked. One or more triggering signals are selected. For each selected triggering signal, one or more states are selected to setup a trigger condition. The hardware device may then be run. The replicated portion of the circuit will be paused when the trigger condition occurs. The states of registers in the replicated portion of the circuit and the sequence of inputs that led to the trigger condition are recorded. This recorded data may then used to generate a test to be run on a software simulator when the circuit is modified.
Public/Granted literature
- US20080270958A1 METHOD AND SYSTEM FOR DEBUG AND TEST USING REPLICATED LOGIC Public/Granted day:2008-10-30
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