Invention Grant
- Patent Title: Method and system for evaluating timing in an integrated circuit
- Patent Title (中): 用于评估集成电路中的定时的方法和系统
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Application No.: US12183549Application Date: 2008-07-31
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Publication No.: US07962874B2Publication Date: 2011-06-14
- Inventor: Eric A. Foreman , Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Anthony D. Polson
- Applicant: Eric A. Foreman , Peter A. Habitz , David J. Hathaway , Jerry D. Hayes , Anthony D. Polson
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safren & Cole, P.C.
- Agent Richard Kotulak
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Methods for analyzing the timing in integrated circuits and for reducing the pessimism in timing slack calculations in static timing analysis (STA). The methods involve grouping and canceling the delay contributions of elements having similar delays in early and late circuit paths. An adjusted timing slack is calculated using the delay contributions of elements having dissimilar delays. In some embodiments, the delay contributions of elements having dissimilar delays are root sum squared. Embodiments of the invention provide methods for reducing the pessimism due to both cell-based and wire-dependent delays. The delays considered in embodiments of the invention may include delays due to the location of elements in a path.
Public/Granted literature
- US20080313590A1 METHOD AND SYSTEM FOR EVALUATING TIMING IN AN INTEGRATED CIRCUIT Public/Granted day:2008-12-18
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