Invention Grant
- Patent Title: Automatic analyzer
- Patent Title (中): 自动分析仪
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Application No.: US12843446Application Date: 2010-07-26
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Publication No.: US07964140B2Publication Date: 2011-06-21
- Inventor: Shigenori Watari
- Applicant: Shigenori Watari
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2003-177434 20030623
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N31/00 ; G01N33/00

Abstract:
An automatic analyzer is disclosed that has a structure capable of using reagent containers each having an ID, such as a barcode, attached either on the top surface or the undersurface thereof, or alternatively on each of them. This automatic analyzer, therefore, allows information about the reagent ID to be read or written at an arbitrary timing even if the mounting density of reagent containers of the automatic analyzer is increased, thereby improving the function and performance of the apparatus.
Public/Granted literature
- US20100288830A1 AUTOMATIC ANALYZER Public/Granted day:2010-11-18
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