Invention Grant
- Patent Title: Low backscatter test method and apparatus
- Patent Title (中): 低背散射测试方法和装置
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Application No.: US12432806Application Date: 2009-04-30
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Publication No.: US07964834B2Publication Date: 2011-06-21
- Inventor: Jonathan L Weber
- Applicant: Jonathan L Weber
- Applicant Address: US NH Nashua
- Assignee: BAE Systems Information and Electronic Systems Integration Inc.
- Current Assignee: BAE Systems Information and Electronic Systems Integration Inc.
- Current Assignee Address: US NH Nashua
- Agency: Vern Maine & Associates
- Main IPC: G01C21/02
- IPC: G01C21/02

Abstract:
A compact instrument enables placement of the instrument such that the image of the laser beam, as retro reflected and diffracted, forms outside the tracking field of view. The target source and beam camera can be located at the focus of a Cassegrain objective. Embodiments include shared objective and twin objective design. With a shared objective design, both the beam projector and profiling camera can see the same focal length. A two objective design can use two different focal lengths.
Public/Granted literature
- US20100276569A1 LOW BACKSCATTER TEST METHOD AND APPARATUS Public/Granted day:2010-11-04
Information query
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