Invention Grant
- Patent Title: Test plate for electronic handler
- Patent Title (中): 电子处理器测试板
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Application No.: US11741921Application Date: 2007-04-30
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Publication No.: US07965091B2Publication Date: 2011-06-21
- Inventor: Gerald F Boe
- Applicant: Gerald F Boe
- Applicant Address: US OR Portland
- Assignee: Electro Scientific Industries, Inc.
- Current Assignee: Electro Scientific Industries, Inc.
- Current Assignee Address: US OR Portland
- Agency: Young Basile
- Main IPC: G01R31/00
- IPC: G01R31/00
Abstract:
A gap set device for an electronic component handler is provided. The electronic component handler includes a test module operative to load, test and unload electronic components. The electronic components are received in test pockets provided on a test plate. The test pockets include at least one corner relief to improve loading efficiency.
Public/Granted literature
- US20080264826A1 Test plate for electronic handler Public/Granted day:2008-10-30
Information query
