Invention Grant
US07965883B2 Image inspection method and image inspection apparatus employing the same
有权
图像检查方法及采用该方法的图像检查装置
- Patent Title: Image inspection method and image inspection apparatus employing the same
- Patent Title (中): 图像检查方法及采用该方法的图像检查装置
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Application No.: US11798477Application Date: 2007-05-14
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Publication No.: US07965883B2Publication Date: 2011-06-21
- Inventor: Hirohisa Nishino , Masahiko Uno
- Applicant: Hirohisa Nishino , Masahiko Uno
- Applicant Address: JP Chiyoda-Ku, Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Chiyoda-Ku, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JP2006-136507 20060516
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/40 ; G01T1/20 ; G03C5/04

Abstract:
The method comprises a first step (S1 in FIG. 1) of obtaining a transmission image, a second step (S2) of applying a quadratic differential filter to the transmission image, thereby to emphasize a part of large luminance change as a quadratic differential filter image, a third step (S3) of binarizing the quadratic differential filter image with a predetermined threshold value, and then storing the resulting binarized image, a fourth step (S4) of binarizing the transmission image with another predetermined threshold value, and then storing the resulting binarized image, a fifth step (S5) of performing the measurement of binary feature quantities for the binarized image stored at the third step (S3) and the binarized image stored at the fourth step (S4), and a sixth step (S6) of deciding the quality of the object to-be-inspected from the binary feature quantities.
Public/Granted literature
- US20070269099A1 Image inspection method and image inspection apparatus employing the same Public/Granted day:2007-11-22
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