Invention Grant
- Patent Title: Workpiece picking apparatus
- Patent Title (中): 工件拾取装置
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Application No.: US11863670Application Date: 2007-09-28
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Publication No.: US07966094B2Publication Date: 2011-06-21
- Inventor: Kazunori Ban , Ichiro Kanno , Keisuke Watanabe
- Applicant: Kazunori Ban , Ichiro Kanno , Keisuke Watanabe
- Applicant Address: JP Yamanashi
- Assignee: Fanuc Ltd
- Current Assignee: Fanuc Ltd
- Current Assignee Address: JP Yamanashi
- Agency: Lowe Hauptman Ham & Berner LLP
- Priority: JP2006-266903 20060929
- Main IPC: G05B15/00
- IPC: G05B15/00

Abstract:
A workpiece picking apparatus includes a robot, a workpiece recognition device for recognizing the workpieces located in a wide area, an accurate measurement device for accurately measuring the three-dimensional position of the workpiece, a workpiece select device for selecting the workpiece to be picked, and an NG workpiece storage device for storing information on the rough position of an failed NG workpiece when the measurement of the three-dimensional position or the picking for the workpiece has failed. The workpiece select device excludes the NG workpiece stored in the NG workpiece storage device and selects the next workpiece to be measured. The robot picks the selected workpiece based on the three-dimensional position of the workpiece measured by the accurate measurement device.
Public/Granted literature
- US20080082213A1 WORKPIECE PICKING APPARATUS Public/Granted day:2008-04-03
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