The method for creating a test pattern and calculating a fault coverage or the like of the present invention is characterized by creating bridging fault voltage information indicating a voltage of a bridging assumed on the wire derived from an output terminal of a cell, calculating a logical threshold of an input terminal of the cell, extracting bridging fault information on an adjacent wire pair, calculating a detection limit resistance value using the logical threshold, adding the detection limit resistance value to bridging fault voltage information, creating extended bridging fault voltage information, creating a bridging fault list including a bridging fault type based on the extended bridging fault voltage information, creating a test pattern based on the bridging fault list, judging whether or not a bridging fault can be detected through this test pattern, creating fault detection information and calculating a weighted fault coverage based on the fault detection information and bridging fault generation information.