Invention Grant
US07966145B2 Integrated circuit and the corresponding test method, computer device and program
有权
集成电路和相应的测试方法，计算机设备和程序
- Patent Title: Integrated circuit and the corresponding test method, computer device and program
- Patent Title (中): 集成电路和相应的测试方法，计算机设备和程序
-
Application No.: US12030568Application Date: 2008-02-13
-
Publication No.: US07966145B2Publication Date: 2011-06-21
- Inventor: David Naccache
- Applicant: David Naccache
- Applicant Address: FR Neuilly sur Seine
- Assignee: Compagnie Industries et Financiere D'Ingenierie “Ingenico”
- Current Assignee: Compagnie Industries et Financiere D'Ingenierie “Ingenico”
- Current Assignee Address: FR Neuilly sur Seine
- Agency: Westman, Champlin & Kelly, P.A.
- Agent David D. Brush
- Priority: FR0701094 20070213
- Main IPC: G01R31/00
- IPC: G01R31/00
Abstract:
An integrated circuit is provided, which includes at least one external input, a power supply and a plurality of elementary components, each having at least one internal input and at least one internal output. The circuit further includes at least one test unit having an AND gate, each input of which is connected to an internal output of one of the elementary components and an output of which is connected to the power supply via a resistor.
Public/Granted literature
- US20080195345A1 INTEGRATED CIRCUIT AND THE CORRESPONDING TEST METHOD, COMPUTER DEVICE AND PROGRAM Public/Granted day:2008-08-14
Information query
