A system and method for testing a plurality of memory blocks in a System on Chip (SOC) design uses two Test Access Ports (TAPs); a user TAP and an EDA tool TAP, to provide instructions and test data to the SOC. The system includes a glue logic block, a secured logic block and a memory testing module. The glue logic block selects the user TAP at the outset of the testing phase. The secured logic block is coupled with the user TAP and generates a TAP selection signal, which controls the selection of the EDA tool TAP. The memory testing module is used to carry out the process of testing the memory blocks when the EDA tool TAP is selected.