Invention Grant
US07966530B2 Methods, devices, and systems for experiencing reduced unequal testing degradation
有权
用于经历减少不相等的测试降级的方法，设备和系统
- Patent Title: Methods, devices, and systems for experiencing reduced unequal testing degradation
- Patent Title (中): 用于经历减少不相等的测试降级的方法，设备和系统
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Application No.: US12002830Application Date: 2007-12-18
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Publication No.: US07966530B2Publication Date: 2011-06-21
- Inventor: Bryce Cook , Nick Labrum
- Applicant: Bryce Cook , Nick Labrum
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C7/00
Abstract:
One or more embodiments of the present invention reduce uneven degradation during testing by providing for a toggling signal to be applied to remaining input paths which do not receive test signals. Therefore, rather than being held in a fixed state during the burn-in process, the remaining inputs are toggled as well. Consequently, they degrade at a more similar rate as their counterpart inputs that did receive test signals.
Public/Granted literature
- US20090158102A1 Methods, devices, and systems for experiencing reduced unequal testing degradation Public/Granted day:2009-06-18
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