Invention Grant
- Patent Title: Memory diagnosis apparatus
- Patent Title (中): 记忆诊断仪
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Application No.: US12093562Application Date: 2006-09-20
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Publication No.: US07966531B2Publication Date: 2011-06-21
- Inventor: Hiroo Kanamaru , Takuya Ishioka
- Applicant: Hiroo Kanamaru , Takuya Ishioka
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2005-329309 20051114
- International Application: PCT/JP2006/318568 WO 20060920
- International Announcement: WO2007/055068 WO 20070518
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
A memory diagnosis apparatus include an intra-word testing unit that tests for a coupling fault in each bit in each word in a memory, an inter-word testing unit that tests for a coupling fault between words in each sub-array each being plural words in the memory, and an inter-block testing unit that tests for a coupling fault between sub-arrays in the memory.
Public/Granted literature
- US20090089631A1 MEMORY DIAGNOSIS APPARATUS Public/Granted day:2009-04-02
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