Invention Grant
- Patent Title: Fault detection circuit
- Patent Title (中): 故障检测电路
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Application No.: US12477129Application Date: 2009-06-03
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Publication No.: US07969157B2Publication Date: 2011-06-28
- Inventor: Chih-Chan Ger , Chi-Chang Lu , Chia-Kun Chen
- Applicant: Chih-Chan Ger , Chi-Chang Lu , Chia-Kun Chen
- Applicant Address: TW Jhongli, Taoyuan County TW Tu-Cheng, New Taipei
- Assignee: Ampower Technology Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Ampower Technology Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW Jhongli, Taoyuan County TW Tu-Cheng, New Taipei
- Agent Raymond J. Chew
- Priority: CN200910106523 20090403
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R31/00 ; H01H31/02

Abstract:
A fault detection circuit connects to and determines the occurrence of failure in an inverter circuit. The inverter circuit comprises three outputs to connect three groups of lamps respectively, and the fault detection circuit comprises a magnetic unit and a signal detection unit. The magnetic unit comprises first, second and third flux generating windings electrically connected to the three outputs of the inverter circuit, and a flux detection winding. If no fault occurs on the outputs of the inverter circuit, total flux generated by the flux generating windings is cancelled out. As long as any fault occurs on the outputs of the inverter circuit, flux generated by the flux generating windings cannot be canceled out, and the flux detection winding is electromagnetically coupled accordingly and driven by the generated flux to output a coupling signal, based on which the signal detection unit generates an alert signal accordingly.
Public/Granted literature
- US20100253365A1 FAULT DETECTION CIRCUIT Public/Granted day:2010-10-07
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