Invention Grant
- Patent Title: Noise-reduction method for processing a test port
- Patent Title (中): 用于处理测试端口的降噪方法
-
Application No.: US12135451Application Date: 2008-06-09
-
Publication No.: US07969158B2Publication Date: 2011-06-28
- Inventor: I-Chen Chen , Chien-Jung Lin , Chien-Hsun Ho
- Applicant: I-Chen Chen , Chien-Jung Lin , Chien-Hsun Ho
- Applicant Address: TW Taoyuan County
- Assignee: Foxconn Communication Technology Corp.
- Current Assignee: Foxconn Communication Technology Corp.
- Current Assignee Address: TW Taoyuan County
- Agent Steven M. Reiss
- Priority: CN200810001109 20080115
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R29/26 ; H01H31/02

Abstract:
A noise-reduction method for processing a port is applied to a test target for testing or being burned in with software. At least one zero-Ohm resistor is provided with a first end thereof electrically connected to a device under test (DUT) of the test target and a second end thereof connected to a test port. Moreover, at least one grounding zero-Ohm resistor is provided with one end connected to ground and the other end is a floating end. After the test target is finished debugging or burned in with software, the connection of the first end and the DUT is disabled, and the second end is connected to ground through the floating end to reduce noise generation and improve a flexibility in circuit layout.
Public/Granted literature
- US20090179653A1 NOISE-REDUCTION METHOD FOR PROCESSING A TEST PORT Public/Granted day:2009-07-16
Information query