Invention Grant
US07969170B2 Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit
有权
具有减少数量的用于传导的滑动触点的微型接触器探头和电探头单元
- Patent Title: Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit
- Patent Title (中): 具有减少数量的用于传导的滑动触点的微型接触器探头和电探头单元
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Application No.: US12219099Application Date: 2008-07-16
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Publication No.: US07969170B2Publication Date: 2011-06-28
- Inventor: Toshio Kazama
- Applicant: Toshio Kazama
- Applicant Address: JP Yokohama-shi, Kanagawa
- Assignee: NHK Spring Co., Ltd.
- Current Assignee: NHK Spring Co., Ltd.
- Current Assignee Address: JP Yokohama-shi, Kanagawa
- Agency: The Nath Law Group
- Agent Jerald L. Meyer; Sungyeop Chung
- Priority: JPP2000-181734 20000616; JPP2000-312088 20001012
- Main IPC: G01R31/20
- IPC: G01R31/20
Abstract:
In order for a conduction path to have a reduced number of sliding portions for conduction, without increase in inductance nor resistance, thereby permitting an enhanced accuracy of inspection, a pair of plungers (3, 4) biased in opposite directions by a coil spring (2), to be electrically connected to a wiring plate (10), have electrical connections in which, in a tubular portion (15) as a tight wound spiral portion (15a) fixed on one plunger (4) to allow linear flow of electrical signal, the other plunger (3) is brought into slidable contact.
Public/Granted literature
- US20090009205A1 Microcontactor probe assembly having a plunger and electric probe module using the same Public/Granted day:2009-01-08
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