Invention Grant
- Patent Title: Temperature detection circuit
- Patent Title (中): 温度检测电路
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Application No.: US12906715Application Date: 2010-10-18
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Publication No.: US07969227B2Publication Date: 2011-06-28
- Inventor: Ryuta Hasegawa , Ryuichi Morikawa , Nobumitsu Tada , Masami Hirata
- Applicant: Ryuta Hasegawa , Ryuichi Morikawa , Nobumitsu Tada , Masami Hirata
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2008-109354 20080418
- Main IPC: H03K3/42
- IPC: H03K3/42

Abstract:
According to one embodiment, a temperature detection circuit is provided which requires only a small number of additional components, thus minimizing an increase in costs and which offers an insulating property and high responsiveness. A temperature detection circuit outputs a first PWM signal corresponding to a temperature of a first temperature sensor from a photointerrupter as a signal insulated from the first temperature sensor. A temperature detection circuit outputs a second PWM signal corresponding to a temperature of a second temperature sensor from a photointerrupter as a signal insulated from the second temperature sensor. A controlling arithmetic apparatus calculates a higher one of the temperatures detected by the first and second temperature sensors based on the PWM signals output from the photointerrupter.
Public/Granted literature
- US20110032001A1 TEMPERATURE DETECTION CIRCUIT Public/Granted day:2011-02-10
Information query
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