Invention Grant
- Patent Title: Correction of cluster defects in imagers
- Patent Title (中): 校正成像器中的簇缺陷
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Application No.: US11195688Application Date: 2005-08-03
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Publication No.: US07969488B2Publication Date: 2011-06-28
- Inventor: Dmitri Jerdev
- Applicant: Dmitri Jerdev
- Applicant Address: US ID Boise
- Assignee: Micron Technologies, Inc.
- Current Assignee: Micron Technologies, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dickstein Shapiro LLP
- Main IPC: H04N9/64
- IPC: H04N9/64
Abstract:
A method and apparatus that allows for the correction of multiple defective pixels in an imager device. In one exemplary embodiment, the method includes the steps of selecting a correction kernel for a defective pixel, determining average and difference values for pixel pairs in the correction kernel, and substituting an average value from a pixel pair for the value of the defective pixel.
Public/Granted literature
- US20070030365A1 Correction of cluster defects in imagers Public/Granted day:2007-02-08
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