Invention Grant
US07969489B2 Defective pixel specifying method, defective pixel specifying system, image correcting method, and image correcting system
有权
缺陷像素指定方法，缺陷像素指定系统，图像校正方法和图像校正系统
- Patent Title: Defective pixel specifying method, defective pixel specifying system, image correcting method, and image correcting system
- Patent Title (中): 缺陷像素指定方法，缺陷像素指定系统，图像校正方法和图像校正系统
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Application No.: US12945608Application Date: 2010-11-12
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Publication No.: US07969489B2Publication Date: 2011-06-28
- Inventor: Hajime Kimura
- Applicant: Hajime Kimura
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2001-057422 20010301
- Main IPC: H04N9/64
- IPC: H04N9/64
Abstract:
A defective pixel specifying method and a defective pixel specifying system for a semiconductor device having a defective pixel are provided. Also provided are an image correcting method and an image correcting system for making a defective pixel inconspicuous on the screen when a read image is displayed. The present invention determines whether or not there is a defective pixel for each pixel and specifies the coordinate of the defective pixel using image signals obtained by reading a plurality of images. The image signal of the defective pixel is set based on the image signals of the pixels adjacent to the defective pixel to correct the image of the subject read.
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